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Ultrasonic Testing in CIVA Education

In CIVA Education UT, two types of computation are available: Beam Computation and Inspection Simulation.

 

 

3D Beam Computation

The features of the UT beam computation module are:

  • Planar and Cylindrical component geometries
  • Isotropic or anisotropic materials
  • Contact (with/without wedge) or Immersion testing
  • Normal or Angle beam
  • Conventional single element probes (circular or rectangular crystal) and linear PA (limited to 28 elements) probes
  • Focused probe available (spherical or cylindrical shape)
  • Point focusing or beam steering with delay laws (for PA probes)
  • Accounts for longitudinal and transverse waves and mode conversions
  • Several skips of the beam can be considered

 

Examples of simulations

In UT, among other possibilities, the beam module of CIVA Education can help you illustrate the following phenomena:

 

  • Visualize and characterize the main parts of the beam for a given probe including the near field, far field, location of the maximum, focal spot size and beam coverage.

 

 

  • Visualize the beam propagation, especially when specific phenomenon occur (propagation in an anisotropic material, grating lobe phenomena with a Phased-Array Probe).

 

 

  • Understand and see the effects of focusing or beam steering.

 

 

  • See the impact of the material velocity on the beam angle.

 

 

  • Visualize the impact of physical parameters such as the probe frequency on the radiated beam.

 

 

  • Evaluate the sensitivity zone of a separate T/R probe (such as TOFD or Tandem) with the combination of the emitted beam and the zone of sensitivity in reception.

 

 

  • And many other possibilities you can discover!

 

2D inspection simulation for qualitative and fast computations

The inspection simulation module includes the following capabilities:

  • Planar and Cylindrical component geometries, weld with 30° V-Bevel
  • Isotropic material
  • Contact or Immersion testing
  • Normal or Angle beam
  • Conventional single element probes (circular or rectangular crystal) and linear PA (limited to 28 elements) probes
  • Pulse Echo, TOFD, Tandem
  • Phased-Array techniques: Point focusing, beam steering, sectorial scanning, TFM –  Full Matrix Capture (PA Probes)
  • Simulations with planar and SDH flaws with various dimensions, locations and orientations
  • Accounts for L waves, T waves and mode conversions

 

Examples of simulations

In UT, among other possibilities and ideas, the inspection simulation module of CIVA Education can help you to illustrate the following points:

 

  • The different types of echoes scattered by an indication or by the component boundaries (diffraction, reflection, corner effect, etc.).

 

 

  • Identify the different modes, including mode conversion phenomena.

 

 

  • Illustrate and compare the different UT techniques: Normal beam, Angled beam, TOFD, Tandem, PA S-Scan, PA TFM, etc.

 

 

 

 

  • Show calibration block set up to obtain DAC like curves.

 

 

  • Understand beam spot sizing technique such as the 6dB drop one and tip diffraction. 

 

 

  • Show the impact of influential parameters on the signal sensitivity (such as flaw location and orientation, or probe parameters…).
  • And many other possibilities!
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