Publications on CIVA and NDT Simulation
Apport des nouveaux modèles Eléments Finis pour la simulation des ultrasons
2026 | COFREND
| Method(s): UT
Author(s):
F. Foucher (EXTENDE)
J. Dudous (EXTENDE)
N. Leymarie (CEA)
E. Demaldent (CEA)
S. Le Berre (CEA)
E. Ginzel (University of Waterloo)
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Austenitic welds phased array ultrasonic inspection modeling and MAPOD study
2026 | ECNDT
| Method(s): UT
Author(s):
B. Clausse (EXTENDE)
A. Pacalis (EXTENDE)
F. Foucher (EXTENDE)
A. Wick (Naval Nuclear Laboratory)
P. Boulware (ARCTOS)
E. Dittman (ARCTOS)
M. Lozev (nde4zero)
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Benefits of new Finite Elements models available for Ultrasonic NDE simulations
2026 | ECNDT
| Method(s): UT
Author(s):
J. Dudous (EXTENDE)
F. Foucher (EXTENDE)
E. Demaldent (CEA)
S. Le Berre (CEA)
N. Leymarie (CEA)
E. Ginzel (University of Waterloo)
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CIVA confirms L-mode in SH Shear wave generation
2026 | NDT.net
| Method(s): UT
Author(s):
E. Ginzel (University of Waterloo)
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CIVA SHM for guided wave simulation: damping model and absorbing boundary layers
2026 | EWSHM
| Method(s): SHM
Author(s):
A. Recoquillay (CEA)
A. Imperiale (CEA)
B. Yilmaz (CEA)
B. Clausse (EXTENDE)
F. Foucher (EXTENDE)
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Démarche MAPoD appliquée à un banc de contrôle automatisé par ultrasons de tubes sans soudure
2026 | COFREND
| Method(s): UT
Author(s):
F. Lefèvre (Vallourec)
B. Ndao (Vallourec)
O. Lazzari (Vallourec)
D. Ouedraogo (EXTENDE)
F. Foucher (EXTENDE)
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Digital Training: How can simulators enhance trainees’ learning?
2026 | ECNDT
| Method(s): ET, GWT, RT/CT, SHM, TT, UT
Author(s):
R. Iglesia (EXTENDE)
B. Puel (EXTENDE)
F. Foucher (EXTENDE)
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Formation digitale : Comment les simulateurs peuvent-ils améliorer l’apprentissage ?
2026 | COFREND
| Method(s): ET, GWT, RT/CT, SHM, TT, UT
Author(s):
R. Iglesia (EXTENDE)
B. Puel (EXTENDE)
F. Foucher (EXTENDE)
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Numerical Modelling of Photon-Counting Detectors for Industrial Radiography Applications
2026 | ECNDT
| Method(s): RT/CT
Author(s):
R. Fernandez (EXTENDE)
A. Touron (CEA)
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Probability of detection of an automated ultrasonic testing inspection system in the seamless pipe industry
2026 | ECNDT
| Method(s): UT
Author(s):
F. Lefèvre (Vallourec)
B. Ndao (Vallourec)
O. Lazzari (Vallourec)
D. Ouedraogo (EXTENDE)
F. Foucher (EXTENDE)