Materials difficult to control, speeding up the inspections without reducing their quality. Complex specimens made of anisotropic heterogeneous mateirals for which quality should be perfect. In both cases, our skills and our tools can be an asset in your development.
WE SECURE YOUR PROBE, MOCK-UP OR NDT PROCESS DESIGN
We display the zone coverage, here with a phased array probe.
We design innovative probes.
Our methodology and our tools allow to optimize the size and the number of elements of your phased array probe.
We check the ability of your probe to detect the flaws you are looking for.
We check that the flaws that have to be inserted in your mock-up are well positionned in order to avoid complex and unwanted interaction (mode conversion...).
FLUX® can simulate infrared thermography inspection (IRT). Examples of temperature charts obtained by simulation for various defect sizes, specimen materials, heating frequencies and durations (Induction Thermography):
WE REDUCE THE TIME NECESsARY TO DEVELOP AND QUALIFY YOUR NDT PROCESS
We can make variations of the values of a parameter for which an experimental variation would be very expansive or impossible: Frequency of the probe, size of the crystal, position or power of a source, tilt of a defect from -80° to 80°, orientation of the anisotropy of the material of the mock-up...
WE EVALUATE THE IMPACT OF INFLUENTial PARAMETERS
Combined variations will allow you to reduce the number of mock-ups you will need, and to evaluate the range in which these parameters will have the most important influence.
You can make all these simulations with CIVA. We can also propose our calculation capabilities to save time, with or without checking your configurations. We can use more that 25 calculation nodes, and we also have internal tools to extract results efficiently and rigourously
In 2013, we have made more than 50 000 calculations for our customers.
We evaluate your process to optimize them
You wish to check an inspection procedure? We can simulate all the different stages from calibration to analysis, while getting through DAC generation, signal processing or results segmentation.
We can evaluate the detection capabilities of the process on target-flaws or in terms of PoD on a distribution of standard flaws.
When the procedure requires several ET or UT inspections per access surface and/or several probes, we can estimate which flaws will be noted by neither of the planned methods. In this case, we can help you think of complementary inspection methods that would allow spotting these flaws. We can also estimate the contribution of each of the different methods on the overall performance, so as to minimize the number of required inspections.
We can also estimate the performances of tomographic reconstruction depending on the number of projections performed, in order to determine the minimal number of shots that allows spotting the indications.